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Development and projects

New crystalline material (rare and precious metals, pure substances and semiconductor metals) production analytical control research

Existing file of domestic standards to rare and precious metal based products analysis methodology is researched.

New approach to standardization of investigated material analytical control methods is suggested using universal methods and means, full-fledged measurement assurance and actual regulatory base. Series of new analytical control tool methods are developed and certified, including among them original mass spectrometric method of solid inorganic substances with improved metrology characteristics stable isotope analysis, complex of improved rare and precious metal product analysis methodology, quick test of secondary raw materials using light-weight X-ray fluorescence devices, atomic emission method of rare metal analysis using photodiode spectrum recording.

Intermethod and interlaboratory comparative experiments are carried out to achieve high accuracy of analysis. In nanomaterial analysis the concept of metrological traceability achievement is separated.


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