A standard sample of single cristals orientations (silicon), a set of OMC
Purpose and scope:
SS of orientation of crystals (silicon), set OMK is used for calibration, control of the metrological characteristics of diffractometers, such as SCS-25 E, URS-50E. DRON-2.0, DRC-2M and other alike. Application: metallurgy, electronic industry.
Orientation SS are represented by geometric shape of the single-crystal silicon of cylindrical shape with height (5-10) mm. Non-working side of the sample is plotted with axes, one of which coincides with the base cut.
Normalized metrological characteristics:
|SS Index in the set||Qualified response||Designation of physical quantities||SS certified value||Absolute error values of qualified SS/em>|
|SS 48-0572-288(1)-2005||Deflection angle plane of cut of a single crystal from the orientation plane (111)||Degrees, Minutes||00±8'||1'|
Expiration of SS, or control period:
Shelf-life of SS - 3 years from the date of issue (certification or recertification)