Structure
Structure JSC «Giredmet» 
A standard sample of single cristals orientations (silicon), a set of OMC
Purpose and scope:
SS of orientation of crystals (silicon), set OMK is used for calibration, control of the metrological characteristics of diffractometers, such as SCS-25 E, URS-50E. DRON-2.0, DRC-2M and other alike. Application: metallurgy, electronic industry.
Background:
Orientation SS are represented by geometric shape of the single-crystal silicon of cylindrical shape with height (5-10) mm. Non-working side of the sample is plotted with axes, one of which coincides with the base cut.
Normalized metrological characteristics:
| SS Index in the set | Qualified response | Designation of physical quantities | SS certified value | Absolute error values of qualified SS/em> |
| SS 48-0572-288(1)-2005 | Deflection angle plane of cut of a single crystal from the orientation plane (111) | Degrees, Minutes | 00±8' | 1' |
| SOP 48-0572-288(2)-2005 | 0020'±8' | 1' | ||
| SOP 48-0572-288(3)-2005 | 0040'±8' | 1' | ||
| SOP 48-0572-288(4)-2005 | 10±8' | 1' |
Expiration of SS, or control period:
Shelf-life of SS - 3 years from the date of issue (certification or recertification)