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Standard samples of the Hall voltage and resistivity (monocrystalline silicon)

 

 

Purpose and scope:
Hall voltage and resistivity SS are designed for testing and calibration of instrument and determination of concentration and mobility of charge carriers of semiconductor materials by Hall method.

Background:
SS is made in the form of geometric figure of monocrystalline silicon of size (10x10x0, 2) mm, fixed in the insulating body of the sample holder. The samples are combined into a set, the set includes 7 SS of a different value of concentration of charge carriers.

Normalized metrological characteristics:
Hall voltage (mV) and electrical resistivity (Ohm·cm). Error in establishing of attestation values - no more than 2%. Terms of SS appraisal: - Accuracy of current measurement 0,1%. The presence of magnetic induction of 2,000 gauss. Heterogeneity of magnetic induction up to 0,05% per 1 cm2. Temperature measurement of resistivity 23 (plus/minus) 0.5 degrees. Accuracy of assessment of SS thickness is no more than 1%.

Expiration of SS or control period:
Expiration of SS - 2 years from the repeated quality test in “Giredmet” JSC.