Metrological Service

Metrological Service of “Giredmet” PJSC develops, manufactures and certifies standard samples of semiconductor materials properties that are used for testing and calibration of measuring the electrical resistivity by 2-probe and 4-probe methods, time of life, and the orientation of single crystals.

Standard samples:

• resistivity (silicon single-crystal n-type), set;
   
• resistivity (monocrystalline silicon), a set WAREC;
   
• resistivity for the two-probe method (monocrystalline silicon);
   
• Hall voltage and resistivity (monocrystalline silicon);
   
• time constant of relaxation of photoconductivity (monocrystalline silicon);
   
• orientation of single crystals (silicon), a set of OMC.
   

Customers of products:

1. "PCMP" JSC, Podolsk.
2. FSUE "GHK", Zheleznogorsk (Krasnoyarsk Territory).
3. SCF "Monocrystal" JSC, Stavropol.
4. "Analog" JSC, Stavropol.
5. "Interkonversinvest" JSC, Moscow.
6. "Elma" JSC, Zelenograd (Moscow region).
7. "Pilar" JSC, Kiev.
8. "KZTSM" JSC, Krasnoyarsk.
9. FSUE Karpov Institute of Ohysical Chemistry, Obninsk.
10. "Mayak" PC, Ozersk (Chelyabinsk region).
11. "Transistor" plant, Minsk.
12. "Electrovipryamitel" JSC, Saransk.
13. "Optron" JSC, Moscow.
14. SPE "Tomilino Electronik Factory" , Ltd, Tomilino (Moscow reg.).
15. "Saturn" JSC, Krasnodar.