Metrological Service
Metrological Service of “Giredmet” PJSC develops, manufactures and certifies standard samples of semiconductor materials properties that are used for testing and calibration of measuring the electrical resistivity by 2-probe and 4-probe methods, time of life, and the orientation of single crystals.
Standard samples:
- resistivity (silicon single-crystal n-type), set;
- resistivity (monocrystalline silicon), a set WAREC;
- resistivity for the two-probe method (monocrystalline silicon);
- Hall voltage and resistivity (monocrystalline silicon);
- time constant of relaxation of photoconductivity (monocrystalline silicon);
- orientation of single crystals (silicon), a set of OMC.
Customers of products:
- "PCMP" JSC, Podolsk.
- FSUE "GHK", Zheleznogorsk (Krasnoyarsk Territory).
- SCF "Monocrystal" JSC, Stavropol.
- "Analog" JSC, Stavropol.
- "Interkonversinvest" JSC, Moscow.
- "Elma" JSC, Zelenograd (Moscow region).
- "Pilar" JSC, Kiev.
- "KZTSM" JSC, Krasnoyarsk.
- FSUE Karpov Institute of Ohysical Chemistry, Obninsk.
- "Mayak" PC, Ozersk (Chelyabinsk region).
- "Transistor" plant, Minsk.
- "Electrovipryamitel" JSC, Saransk.
- "Optron" JSC, Moscow.
- SPE "Tomilino Electronik Factory" , Ltd, Tomilino (Moscow reg.).
- "Saturn" JSC, Krasnodar.